英国物理学会
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作者:Jaroslav Jánský , Sylvain Gaychet , Delphine Bessières ...
来源:[J].Journal of Physics D: Applied Physics(IF 2.528), 2014, Vol.47 (6)IOP
摘要:Back discharge refers to any discharges initiated at or near a dielectric layer covering a passive electrode (Czech et al 2011 Eur. Phys. J. D 65 459–74). Back discharge activity is commonly observed in electrostatic precipitators. This study aims to contribute to increasing...
作者:S Abou Rich , T Dufour , P Leroy ...
来源:[J].Journal of Physics D: Applied Physics(IF 2.528), 2014, Vol.47 (6)IOP
摘要:To optimize the adhesion of layers presenting strong barrier properties on low-density polyethylene (LDPE) surfaces, we investigated the influence of argon and argon–oxygen atmospheric pressure post-discharges. This study was performed using x-ray photoelectron spectroscopy,...
作者:T Welzel , S Mändl , K Ellmer
来源:[J].Journal of Physics D: Applied Physics(IF 2.528), 2014, Vol.47 (6)IOP
摘要:Plasma ion mass spectrometry using a plasma process monitor (PPM) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) have been complementarily employed to investigate the sputtering and ion formation processes of Al-doped zinc oxide. By comparing the mass spectra, insi...
作者:Rabindar K Sharma , G B Reddy
来源:[J].Journal of Physics D: Applied Physics(IF 2.528), 2014, Vol.47 (6)IOP
摘要:In this paper, we report the fabrication of three-dimensional molybdenum oxide ( α -MoO3) microspheres (MSs) packed with nanoflakes by facile and eco-friendly physical vapour deposition processes. Synthesis processes include sequences of plasma-assisted sublimatio...
作者:S Lee , Y E Jeong , D Lee ...
来源:[J].Journal of Physics D: Applied Physics(IF 2.528), 2014, Vol.47 (6)IOP
摘要:In this study, the oxygen partial pressure dependent physical properties of phosphorous-doped ZnO thin films were investigated. All thin films, grown on Al2O3(0 0 0 1) substrates using pulsed laser deposition, exhibited (0 0 2) orientation regardless of the ...
作者:Alexander Klassen , Andreas Bauereiß , Carolin Körner
来源:[J].Journal of Physics D: Applied Physics(IF 2.528), 2014, Vol.47 (6)IOP
摘要:Computational modelling of processes that involve highly energetic electrons like electron beam melting, welding, drilling or electron beam lithography, to name but a few, requires information about the attenuation of the electron beam as it passes through the sample. Depth–...
作者:D De Tommasi , G Puglisi , G Zurlo
来源:[J].Journal of Physics D: Applied Physics(IF 2.528), 2014, Vol.47 (6)IOP
摘要:Based on an energy minimization approach, we analyse the elastic deformations of a thin electroactive polymer (EAP) film sandwiched by two elastic electrodes with non-negligible stiffness. We analytically show the existence of a critical value of the electrode voltage for which n...
作者:Guvenc Akgul , Funda Aksoy Akgul , Emre Mulazimoglu ...
来源:[J].Journal of Physics D: Applied Physics(IF 2.528), 2014, Vol.47 (6)IOP
摘要:In this study, copper oxide (CuO) thin film/silicon (Si) nanowire heterojunctions have been fabricated and their optoelectronic performances have been investigated. Vertically aligned n-type Si nanowires have been fabricated using metal-assisted etching (MAE) technique. CuO ...
作者:A Dolgov , D Lopaev , T Rachimova ...
来源:[J].Journal of Physics D: Applied Physics(IF 2.528), 2014, Vol.47 (6)IOP
摘要:Cleaning of contamination of optical surfaces by amorphous carbon (a-C) is highly relevant for extreme ultraviolet (EUV) lithography. We have studied the mechanisms for a-C removal from a Si surface. By comparing a-C removal in a surface wave discharge (SWD) plasma and an EU...

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