国际光学工程学会
期刊
会议
图书
作者:Junfeng Jing , Xiaoting Fan , Pengfei Li
来源:[J].Optical Engineering(IF 0.88), 2016, Vol.55 (5), pp.053109-053109SPIE
摘要:Automatic patterned fabric defect detection is a promising technique for textile manufacturing due to its low cost and high efficiency. The applicability of most existing algorithms, however, is limited by their intensive computation. To overcome or alleviate the problem, th...

我们正在为您处理中,这可能需要一些时间,请稍等。

资源合作:cnki.scholar@cnki.net, +86-10-82896619   意见反馈:scholar@cnki.net

×