英国物理学会
期刊
会议
图书
作者:... Z. Luo , X. Yue , J. Cheng
来源:[J].Journal of Instrumentation(IF 1.869), 2014, Vol.9 (11)IOP
摘要:Muon tomography is an advanced technology to non-destructively detect high atomic number materials. It exploits the multiple Coulomb scattering information of muon to reconstruct the scattering density image of the traversed object. Because of the statistics of muon scattering, t...

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