英国物理学会
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作者:Sai Bharadwaj Vishnubhotla , Rimei Chen ...
来源:[J].Nanotechnology(IF 3.842), 2019, Vol.30 (3)IOP
摘要:Metal nanocontacts play a critical role in atomic force microscopy, functional nanostructures, metallic nanoparticles, and nanoscale electromechanical devices. In all cases, knowledge of the area of contact, and its variation with load, is critical for the quantitative predi...
作者:Sai Bharadwaj Vishnubhotla , Rimei Chen ...
来源:[J].Nanotechnology(IF 3.842), 2019, Vol.30 (4)IOP
摘要:Conductive modes of atomic force microscopy are widely used to characterize the electronic properties of materials, and in such measurements, contact size is typically determined from current flow. Conversely, in nanodevice applications, the current flow is predicted from the est...

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