剑桥大学出版社期刊
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作者:Rosalía Poyato , Bryan D. Huey , Nitin P. Padture
来源:[J].Journal of Materials Research(IF 1.713), 2006, Vol.21 (3), pp.547-551
摘要:Piezoresponse atomic-force microscopy (PFM) has been used to characterize the local piezoelectric properties of a novel, nanotube-patterned (“honeycomb”) thin film of BaTiO3 on Ti substrate synthesized hydrothermally at 200 °C. PFM amplitude and phase images,...

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