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作者:Paolo Crippa , Simone Orcioni
来源:[J].Analog Integrated Circuits and Signal Processing(IF 0.553), 2001, Vol.29 (3)Springer
摘要:AbstractIn this paper a statistical design procedure for the parametric yield optimization based on Simulated Annealing and Quasi-Newton algorithms is presented. A rigorous formulation of the yield taking into account both inter-die and intra-die (mismatch) device variations has ...
作者:Paolo Crippa , Simone Orcioni ...
来源:[J].Analog Integrated Circuits and Signal Processing(IF 0.553), 2003, Vol.37 (2)Springer
摘要:AbstractIn this paper a novel CAD methodology for yield enhancement of VLSI CMOS circuits including random device variations is presented. The methodology is based on a preliminary characterization of the technological process by means of specific test chips for accurate mismatch...
作者:Paolo Crippa , Laura Falaschetti ...
来源:[J].EURASIP Journal on Embedded Systems, 2017, Vol.2017 (1), pp.1-10Springer
摘要:As the adoption of sensing and control networks rises to encompass the most diverse fields, the need for simple, efficient interconnection between many different devices will become ever more pressing. Though wireless communication is certainly appealing, current technologic...
作者:Paolo Crippa , Laura Falaschetti ...
来源:[J].EURASIP Journal on Embedded Systems, 2017, Vol.2017 (1), pp.1-10Springer
摘要:As the adoption of sensing and control networks rises to encompass the most diverse fields, the need for simple, efficient interconnection between many different devices will become ever more pressing. Though wireless communication is certainly appealing, current technologic...

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