剑桥大学出版社期刊
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作者:Oleg V. Kolosov , Ronald G. Polcawich
来源:[J].Journal of Materials Research(IF 1.713), 2015, Vol.30 (3), pp.429-441
摘要:Microelectromechanical systems (MEMS) are increasingly at our fingertips. To understand and thereby improve their performance, especially given their ever-decreasing sizes, it is crucial to measure their functionality in situ. Atomic force microscopy (AFM) is well suited for...
作者:... Ilja Grishin , Oleg V. Kolosov , Bryan D. Huey
来源:[J].Journal of Materials Research(IF 1.713), 2013, Vol.28 (24), pp.3311-3321
摘要:A new approach has been developed for nanoscale conductance mapping (NCM) based on multidimensional atomic force microscopy (AFM) to efficiently investigate the nanoscale electronic properties of heterogeneous surfaces. The technique uses a sequence of conductive AFM images,...

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