G.V. Kurdyumov金属物理研究院,乌克兰国家科学院
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作者:L. V. Poperenko, A. L. Yampolskiy, O. V. Makarenko, O. I. Zavalistyi
来源:[J].Metallofiz. Noveishie Tekhnol.(IF 0.108), 2019, Vol.41 (06), pp.751-764N.A.S. of Ukraine
摘要:Angular dependences of ellipsometric parameters $\psi$ and $\Delta$ at external reflection as well as an internal reflection coefficient are experimentally measured for hybrid structures based on thin Au, Ag or Cu films protected by dielectric layers HfO$_2$ or MgF$_2$. Using num...

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