作者：L. V. Poperenko, A. L. Yampolskiy, O. V. Makarenko, O. I. Zavalistyi 来源：[J].Metallofiz. Noveishie Tekhnol.(IF 0.108), 2019, Vol.41 (06), pp.751-764N.A.S. of Ukraine 摘要：Angular dependences of ellipsometric parameters $\psi$ and $\Delta$ at external reflection as well as an internal reflection coefficient are experimentally measured for hybrid structures based on thin Au, Ag or Cu films protected by dielectric layers HfO$_2$ or MgF$_2$. Using num...