国际光学工程学会
期刊
会议
图书
作者:Kamal K. Pant , Mohamed Bichra ...
来源:[J].Optical Engineering(IF 0.88), 2017, Vol.56 (8), pp.084107-084107SPIE
摘要:The metrology of freeform wavefront can be performed by the use of a noninterferometric method, such as a Shack–Hartmann sensor (SHS). Detailed experimental investigations employing an SHS as metrology head are presented. The scheme is of nonnull nature where small subapertu...

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