剑桥大学出版社期刊
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作者:... H. Ohwa , N. Yasuda , K. Ohwada
来源:[J].MRS Proceedings, 2012, Vol.1397Cambridge U Press
摘要:ABSTRACT We have investigated microstructures in both the antiferroelectric (AFE) and relaxor states of Pb(In1/2Nb1/2)O3 (PIN) with the perovskite structure by a transmission electron microscopy (TEM). Electron diffraction (ED) experiments revealed that...
作者:... Y. Deguchi , Y. Yamamoto , K. Ohwada
来源:[J].MRS Proceedings, 1996, Vol.441Cambridge U Press
摘要:Abstract Zinc oxide (ZnO) thin films have been grown by radio frequency sputtering on glass, Al, Au and R cut sapphire substrates. Microstructures of the ZnO / substrate interface have been observed by transmission electron microscope. The purpose of this study is to elucidate th...
作者:... K. Inoue , Y. Yoshino , K. Ohwada
来源:[J].MRS Proceedings, 1998, Vol.518Cambridge U Press
摘要:Abstract The improvement of thickness distribution and crystallinity in ZnO thin films prepared by radio frequency (rf) planer magnetron sputtering has been studied. Optimum thickness distribution of less than ± 2.2% in a 3-inch wafer is obtained by changing the substrate an...

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