剑桥大学出版社期刊
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作者:Ilja Grishin , Oleg V. Kolosov
来源:[J].Journal of Materials Research(IF 1.713), 2013, Vol.28 (24), pp.3311-3321
摘要:A new approach has been developed for nanoscale conductance mapping (NCM) based on multidimensional atomic force microscopy (AFM) to efficiently investigate the nanoscale electronic properties of heterogeneous surfaces. The technique uses a sequence of conductive AFM images,...

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