剑桥大学出版社期刊
期刊
会议
图书
作者:Giovanni Esteves , Chris M. Fancher , Jacob L. Jones
来源:[J].Journal of Materials Research(IF 1.713), 2014, Vol.30 (3), pp.340-356
摘要:X-ray and neutron diffraction are particularly useful for characterizing ferroelectric materials in situ, e.g., during application of temperature, pressure, electric field, and stress. In this review, we introduce many experimental approaches for such measurements and highlight i...

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