剑桥大学出版社期刊
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作者:Chris M. Fancher , Scott D. Findlay ...
来源:[J].Microscopy and Microanalysis(IF 2.495), 2015, Vol.21 (4), pp.946-952
摘要:Abstract Here, we report reproducible and accurate measurement of crystallographic parameters using scanning transmission electron microscopy. This is made possible by removing drift and residual scan distortion. We demonstrate real-space lattice parameter measurements with <0.1%...
作者:Giovanni Esteves , Chris M. Fancher , Jacob L. Jones
来源:[J].Journal of Materials Research(IF 1.713), 2014, Vol.30 (3), pp.340-356
摘要:X-ray and neutron diffraction are particularly useful for characterizing ferroelectric materials in situ, e.g., during application of temperature, pressure, electric field, and stress. In this review, we introduce many experimental approaches for such measurements and highlight i...

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