全部文献期刊学位论文会议报纸专利标准年鉴图书|学者科研项目
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作者:E. M. Moroz
来源:[J].Journal of Structural Chemistry(IF 0.575), 2017, Vol.58 (8), pp.1510-1514Springer
摘要:The possibilities of using powder X-ray diffraction methods in the study of carbon materials are discussed. To determine the phase composition of the crystalline materials the X-ray phase analysis is employed; the real structure is established by the harmonic analysis of diffraction...
作者:Yuanyuan Liu , Shaomin Lei , Yang Li ...
来源:[J].Journal of Wuhan University of Technology-Mater. Sci. Ed.(IF 0.484), 2019, Vol.34 (3), pp.614-621Springer
摘要:Abstract(#br)The influence of replacement level of calcined coal-series kaolin (CCK) on hydration of ordinary Portland cement (OPC) was studied by X-ray diffraction(XRD)/Rietveld method. X-ray diffraction/Rietveld method was used to quantify the crystalline phase composition...
作者:Marinkovic Bojan , Avillez Roberto Ribeiro de , Saavedra Alvaro ...
来源:[J].Materials Research(IF 0.516), 2001, Vol.4 (2), pp.71DOAJ
摘要:The fundamental parameters approach is used to simulate the instrument contribution to the X-Ray diffraction profile. This procedure eliminates the need to experimentally prepare a reference sample of the studied crystalline material when using the Warren-Averbach method to i...
作者:Bojan Marinkovic , Roberto Ribeiro de Avillez , Alvaro Saavedra ...
来源:[J].Materials Research(IF 0.516), 2001, Vol.4 (2), pp.71-76DOAJ
摘要:The fundamental parameters approach is used to simulate the instrument contribution to the X-Ray diffraction profile. This procedure eliminates the need to experimentally prepare a reference sample of the studied crystalline material when using the Warren-Averbach method to i...
作者:Marinkovic Bojan , Avillez Roberto Ribeiro de , Saavedra Alvaro ...
来源:[J].Materials Research(IF 0.516), 2001, Vol.4 (2), pp.71-76DOAJ
摘要:The fundamental parameters approach is used to simulate the instrument contribution to the X-Ray diffraction profile. This procedure eliminates the need to experimentally prepare a reference sample of the studied crystalline material when using the Warren-Averbach method to i...
作者:Zeynep Demircioğlu , Fethi Ahmet Özdemir , Osman Dayan ...
来源:[J].Journal of Molecular Structure(IF 1.404), 2018, Vol.1161, pp.122-137Elsevier
摘要:... Two new Schiff base ligands containing aromatic sulfonamide fragment of (Z)-N-(2-((3-nitrobenzylidene)amino)phenyl)benzenesulfonamide 3 and (Z)-N-(2-((4-nitrobenzylidene)amino)phenyl)benzenesulfonamide 4 were synthesized and investigated by spectroscopic techniques including 1 H and 13 C NMR, FT-IR, single crystal X-ray...
作者:É. M. Moroz
来源:[J].Journal of Structural Chemistry(IF 0.575), 2012, Vol.53 (1), pp.63-85Springer
摘要:Abstract(#br)X-ray diffraction structural diagnostics of nanomaterials needs the development of special methods taking into account the features of X-ray scattering from small objects. Data on the development of the X-ray diffraction method of the radial electron density dis...
作者:P. Angerer , T. Klünsner , M. Morstein ...
来源:[J].International Journal of Refractory Metals and Hard Materials(IF 1.858), 2019Elsevier
摘要:... In the current work, the equi-penetration grazing incidence X-ray diffraction (EP-GIXD) method was adapted for the determination of the residual stress depth profile in the WC-Co hardmetal substrate below an AlCrN-based hard coating. The limits of this method in terms of coat...
作者:Manojit De , H S Tewari
来源:[J].Pramana(IF 0.562), 2017, Vol.89 (1)Springer
摘要:In the present paper, we are reporting the synthesis of pure nickel and magnesium ferrite [ \(\hbox {NiFe}_2\hbox {O}_4\) , \(\hbox {MgFe}_2\hbox {O}_4\) ] and magnesium-substituted nickel ferrite \((\hbox {Ni}_{1-x}\hbox {Mg}_{x/y}\hbox {Fe}_{2-y}\hbox {O}_4; x=y=0.60)\) on A/B ...
作者:B. Levieil , F. Bridier , C. Doudard ...
来源:[J].Experimental Mechanics(IF 1.548), 2016, Vol.56 (9), pp.1641-1652Springer
摘要:Abstract(#br)The combination of various residual stress measurement methods is a common practice to complete knowledge that a single measurement method cannot provide. In this study, incremental X-Ray diffraction is combined with the contour method to measure a bent notched speci...

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