全部文献期刊会议图书|学者科研项目
中外文文献  中文文献  外文文献
作者:... David A. Knecht , Oleg V. Kolosov , Bryan D. Huey
来源:[J].Ultrasonics Sonochemistry(IF 3.516), 2019, Vol.57, pp.193-202
摘要:Abstract(#br)Acoustic tweezers facilitate the manipulation of objects using sound waves. With the current state of the technology one can only control mobility for a single or few microparticles. This article presents a state of the art system where an Acoustic Lens was used...
作者:... Dagou A. Zeze , Vladimir G. Dubrovskii , Oleg V. Kolosov
来源:[J].Ultramicroscopy(IF 2.47), 2016, Vol.162, pp.42-51
摘要:Abstract(#br)Scanning thermal microscopy (SThM), which enables measurement of thermal transport and temperature distribution in devices and materials with nanoscale resolution is rapidly becoming a key approach in resolving heat dissipation problems in modern processors and ...
作者:Franco Dinelli , Cristiano Albonetti , Oleg V. Kolosov
来源:[J].Ultramicroscopy(IF 2.47), 2010, Vol.111 (4), pp.267-272
摘要:Abstract(#br)The analysis of the formation of ultra-thin organic films is a very important issue. In fact, it is known that the properties of organic light emitting diodes and field effect transistors are strongly affected by the early growth stages. For instance, in the case of ...
作者:Oleg V. Kolosov , Ronald G. Polcawich
来源:[J].Journal of Materials Research(IF 1.713), 2015, Vol.30 (3), pp.429-441
摘要:Microelectromechanical systems (MEMS) are increasingly at our fingertips. To understand and thereby improve their performance, especially given their ever-decreasing sizes, it is crucial to measure their functionality in situ. Atomic force microscopy (AFM) is well suited for...
作者:... Ilja Grishin , Oleg V. Kolosov , Bryan D. Huey
来源:[J].Journal of Materials Research(IF 1.713), 2013, Vol.28 (24), pp.3311-3321
摘要:A new approach has been developed for nanoscale conductance mapping (NCM) based on multidimensional atomic force microscopy (AFM) to efficiently investigate the nanoscale electronic properties of heterogeneous surfaces. The technique uses a sequence of conductive AFM images,...

我们正在为您处理中,这可能需要一些时间,请稍等。

资源合作:cnki.scholar@cnki.net, +86-10-82896619   意见反馈:scholar@cnki.net

×