全部文献期刊会议图书|学者科研项目
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作者:Giovanni Esteves , Chris M. Fancher ...
来源:[J].Acta Materialia(IF 3.941), 2017, Vol.132, pp.96-105
摘要:Abstract(#br)The effects of electrical and mechanical loading on the behavior of domains and phases in Multilayer Piezoelectric Actuators (MAs) is studied using in situ high-energy X-ray diffraction (XRD) and macroscopic property measurements. Rietveld refinement is carried ...
作者:Giovanni Esteves , Thanakorn Iamsasri ...
来源:[J].Journal of the European Ceramic Society(IF 2.36), 2016, Vol.36 (10), pp.2489-2494Elsevier
摘要:Abstract(#br)The origins of high piezoelectric properties in the lead-free (K,Na)NbO 3 -based tetragonal composition (K 0.44 Na 0.52 Li 0.04 )(Nb 0.86 Ta 0.10 Sb 0.04 )O 3 (KNL-NTS) is investigated by quantifying the intrinsic and extrinsic contributions from high energy X-r...
作者:Giovanni Esteves , Chris M. Fancher , Jacob L. Jones
来源:[J].Journal of Materials Research(IF 1.713), 2014, Vol.30 (3), pp.340-356
摘要:X-ray and neutron diffraction are particularly useful for characterizing ferroelectric materials in situ, e.g., during application of temperature, pressure, electric field, and stress. In this review, we introduce many experimental approaches for such measurements and highlight i...
作者:Giovanni Esteves , Chris M Fancher ...
来源:[J].Technometrics(IF 1.424), 2019, Vol.61 (4)ProQuest
摘要:Central composite designs (CCDs) are widely accepted and used experimental designs for fitting secondorder polynomial models in response surface methods. However, these designs are based only on the number of explanatory variables being investigated. In a multiresponse problem wh...
作者:Giovanni Esteves , Chris M. Fancher , Jacob L. Jones
来源:[J].Journal of Materials Research(IF 1.713), 2014, Vol.30 (3), pp.340-356Cambridge U Press
摘要:X-ray and neutron diffraction are particularly useful for characterizing ferroelectric materials in situ, e.g., during application of temperature, pressure, electric field, and stress. In this review, we introduce many experimental approaches for such measurements and highlight i...

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