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作者:Yi Zheng , Xiao Zhang , Shaodong Wang ...
来源:[J].Optics and Lasers in Engineering(IF 1.916), 2020, Vol.126
摘要:... However, disagreements may arise when we use different technologies to measure the topography of the same sample surface due to noise, sampling or optical properties of the sample surface, which may cause miscommunications or confusions between manufacturers. Thus, proposin...
作者:E.W. Cornell , V. Fadeyev , C. Haber ...
来源:[J].Nuclear Inst. and Methods in Physics Research, A(IF 1.142), 2007, Vol.579 (2), pp.901-904
摘要:... An ongoing effort at Berkeley Lab has applied methods of optical metrology and image processing to reconstruct sound stored on these mechanical carriers. This approach was inspired by the use of precision optical metrology to align and fabricate silicon tracking arrays for hi...
作者:K. Kaznatcheev , P.Z. Takacs
来源:[J].Nuclear Inst. and Methods in Physics Research, A(IF 1.142), 2010, Vol.649 (1), pp.144-146
摘要:Abstract(#br)Rapid progress in synchrotron optics performance places a high demand on optical characterization techniques used to validate surface parameters prior to installation of the X-ray optics. It is now necessary to characterize optical surface figure and slope errors an...
作者:Brian Yates , Dylan Maxwell , Siyue Chen ...
来源:[J].Nuclear Inst. and Methods in Physics Research, A(IF 1.142), 2007, Vol.582 (1), pp.146-148
摘要:Abstract(#br)This paper describes the Canadian Light Source Optical Metrology Facility, in which three complementary measurement systems permit complete analysis of the synchrotron beamline optical components. A newly designed optical tip/tilt stage to handle large synchrotron mi...
作者:Mourad Idir , Konstantine Kaznatcheev , Shinan Qian ...
来源:[J].Nuclear Inst. and Methods in Physics Research, A(IF 1.142), 2013, Vol.710, pp.17-23
摘要:... This enhancement is directly linked to the development of the necessary tools to control these optical components. These metrology tools are necessary for the fabrication (to guide some polishing deterministic process) and also for the ultimate characterization used to valida...
作者:M.M. Talha , Jun Chang , Yongtian Wang ...
来源:[J].Optik - International Journal for Light and Electron Optics(IF 0.524), 2009, Vol.121 (24), pp.2262-2265
摘要:Abstract(#br)A computer-generated hologram (CGH) null compensator has been designed for optical metrology of a freeform surface (FFS) with positive base radius. The CGH is being employed in the freeform testing for the first time. The basic concept of the optical metrology and th...
作者:A. Laskarakis
来源:[J].Thin Solid Films(IF 1.604), 2018, Vol.648, pp.62-68
摘要:... In this work, we present a comprehensive optical metrology methodology for the determination of the morphology of well-established polymer blends that include poly(3-hexylthiophene (P3HT) donors and phenyl-C61-butyric acid methyl ester (PC 60 BM) and phenyl-C71-butyric aci...
作者:Chao Xie , Shengyi Li , Shangyong Chen
来源:[J].Optik - International Journal for Light and Electron Optics(IF 0.524), 2013
摘要:Abstract(#br)A phase retrieval technology including a variable optical null which can extend the range of it in optical metrology was proposed. The variable optical null (VON) is composed of two rotated Zernike plates implemented by computer generated holograms (CGHs) which can g...
作者:Guanchang Jin
来源:[J].Optics and Lasers in Engineering(IF 1.916), 1996, Vol.25 (2), pp.81-91
摘要:Abstract(#br)A novel application of NDT to the electronic industry using computer-aided optical metrology that includes Electronic Speckle Pattern Interferometer (ESPI), Electronic Shearing Speckle Pattern Interferometer (ESSPI) and Digital Speckle Correlation Method (DSCM) ...
作者:Paul Kumar Upputuri , Manojit Pramanik , Krishna Mohan Nandigana ...
来源:[J].Optics and Lasers in Engineering(IF 1.916), 2016, Vol.84, pp.10-25
摘要:Abstract(#br)Interferometry has been widely used for optical metrology and imaging applications because of their precision, reliability, and versatility. Although single-wavelength interferometery can provide high sensitivity and resolution, it has several drawbacks, namely, it f...

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