世界科技出版公司期刊
期刊
会议
图书
作者:V. Saveetha , S. Sophia
来源:[J].Journal of Circuits, Systems and Computers(IF 0.238), 2018, Vol.27 (13)World Scientific Publishing
摘要:Parallel discovery of inherent clusters using massively threaded architectures is the solution for handling computational challenges raised by fat datasets in cluster analysis. The Graphics Processing Unit and Compute Unified Device Architecture form a convincing platform to para...
作者:Hui Lin , Dongsheng Liu , Cong Zhang ...
来源:[J].Journal of Circuits, Systems and Computers(IF 0.238), 2018, Vol.27 (13)World Scientific Publishing
摘要:Due to its advantage of quantum resistance and the provable security under some worst-case hardness assumptions, lattice-based cryptography is being increasingly researched. This paper tries to explore and present a novel lattice-based public key cryptography and its impleme...
作者:Avaneesh K. Dubey , R. K. Nagaria
来源:[J].Journal of Circuits, Systems and Computers(IF 0.238), 2018, Vol.27 (13)World Scientific Publishing
摘要:A new design technique is proposed and discussed for the design of active load using the bulk-driven method. The proposed method uses gate-driven input drivers with bulk-driven MOS load. Further, it is used to design single stage amplifiers, such as common source (CS) and common ...
作者:Jin Wu , Pengfei Dai , Jie Peng ...
来源:[J].Journal of Circuits, Systems and Computers(IF 0.238), 2018, Vol.27 (13)World Scientific Publishing
摘要:The fundamental theories and primary structures for the multi-branch self-biasing circuits are reviewed in this paper. First, the Δ V / R and V / R structures illustrating the static current definition mechanism are presented, including the conditions of starting up and ente...
作者:Abdoul Rjoub , Ehab M. Ghabashneh
来源:[J].Journal of Circuits, Systems and Computers(IF 0.238), 2018, Vol.27 (13)World Scientific Publishing
摘要:The demand for high performance, low power/secured handheld equipment increased the need for high speed/low energy and efficient encryption/decryption algorithms. Recently, efficient techniques were suggested to increase the standard of security as well as the speed of portable a...
作者:Talal Bonny , Safaa Henno
来源:[J].Journal of Circuits, Systems and Computers(IF 0.238), 2018, Vol.27 (13)World Scientific Publishing
摘要:The process to locate objects in an image passes through different phases. At the forefront of these phases, and most importantly, is the edge detection. If edges in an image are identified accurately, all of the objects will be located correctly for further processing phases. No...
作者:S. H. Esmaeli , S. H. Sedighy
来源:[J].Journal of Circuits, Systems and Computers(IF 0.238), 2018, Vol.27 (13)World Scientific Publishing
摘要:A compact microstrip diplexer with low insertion loss and high isolation is proposed by combination of two coupled line bandpass filters (BPFs). An additional zero in the lower BPF transmission is created by a coupling capacitance which can be tuned at the higher channel and impr...
作者:Ramin Rajaei
来源:[J].Journal of Circuits, Systems and Computers(IF 0.238), 2018, Vol.27 (13)World Scientific Publishing
摘要:Very large-scale integrated circuit (VLSI) design faces many challenges with today’s nanometer CMOS technology, including leakage current and reliability issues. Magnetic tunnel junction (MTJ) hybrid with CMOS transistors can offer many advantages for future VLSI design such...
作者:C. Gnanavel , S. Albert Alexander
来源:[J].Journal of Circuits, Systems and Computers(IF 0.238), 2018, Vol.27 (13)World Scientific Publishing
摘要:This paper presents an 11-level symmetrical inverter with reduced number of semiconductor switches for the solar photovoltaic (PV) applications. The genetic algorithm (GA) and queen bee assisted genetic algorithm (QBAGA) are performing a major task for the proposed Multilevel Inv...
作者:Biswajit Bhowmik , Jatindra Kumar Deka , Santosh Biswas
来源:[J].Journal of Circuits, Systems and Computers(IF 0.238), 2018, Vol.27 (13)World Scientific Publishing
摘要:Reliability has become a major concern when link-wires in on-chip networks (NoCs) suffer from stuck-at faults (SAFs). This paper presents an extended and scalable test scheme that addresses these faults in NoC links to improve yield and reliability. The scheme detects the stuck-a...

我们正在为您处理中,这可能需要一些时间,请稍等。

资源合作:cnki.scholar@cnki.net, +86-10-82896619   意见反馈:scholar@cnki.net

×